X - Ray Photoelectron Spectroscopy (XPS) Analysis ofPhosphating Film White Spot Structure

doi:10.16577/j.cnki.42-1215/tb.2021.08.029

LIU Jie-li, FU Wen-zhe, ZHAO Guang-xing, ZHANG Lei, LI Zhao-yang, WANG Xiao-zhan

Materials Protection ›› 2021, Vol. 54 ›› Issue (8) : 168.

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Materials Protection ›› 2021, Vol. 54 ›› Issue (8) : 168. DOI: 10.16577/j.cnki.42-1215/tb.2021.08.029

X - Ray Photoelectron Spectroscopy (XPS) Analysis ofPhosphating Film White Spot Structure

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2021, 54(8): 168 https://doi.org/10.16577/j.cnki.42-1215/tb.2021.08.029

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