Effect of Ion Magnetron Sputtering Method on Scanning Electron Microscopy (SEM)Images of Materials with Different Surface Properties

doi:10.16577/j.issn.1001-1560.2024.0275

ZHANG Jie, ZOU Junwen, LIU Xueguang, LI Xiaoying

Materials Protection ›› 2024, Vol. 57 ›› Issue (12) : 107-113.

PDF(7867 KB)

Materials Protection ›› 2024, Vol. 57 ›› Issue (12) : 107-113. DOI: 10.16577/j.issn.1001-1560.2024.0275

Effect of Ion Magnetron Sputtering Method on Scanning Electron Microscopy (SEM)Images of Materials with Different Surface Properties

{{article.zuoZhe_EN}}

Author information +

History +

HeighLight

Abstract

Key words

QR code of this article

Cite this article

EndNote

Ris (Procite)

Bibtex

Download Citations

{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2024, 57(12): 107-113 https://doi.org/10.16577/j.issn.1001-1560.2024.0275

References

Publishing order | Descend order by publishing year | Descend order by cited within

References

Funding

RIGHTS & PERMISSIONS

PDF(7867 KB)

Accesses

Citation

Detail

Sections

Recommended

Please choose a citation manager

Content to export